Powders and fine particles are widely used for research and development and quality control in many industrial and academic fields, such as ceramics, functional polymers, food, cosmetics, pharmaceuticals, chemical industry, semiconductors, catalysts, battery materials, and life sciences. Particle measurements such as particle size distribution, nanoparticle size distribution, zeta potential, molecular weight, and image analysis are essential to know the characteristics of various particles. In semiconductor field, the particle size in the CMP slurry is the key factor of the performance for CMP process.
HORIBA's Partica series of laser diffraction/scattering particle size distribution analyzers has always led the world in the field of particle size distribution measurement, driving the research and development of advanced materials and improving their quality.
Centrifugal Nanoparticle Analyzer
Laser Scattering Particle Size Distribution Analyzer
Laser Scattering Particle Size Distribution Analyzer
Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)
Nanoparticle Analyzer
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