Metal and Mining

Stainless steel, Ti, Al, and Cu are commonly used as metal 3D printing materials, and customers have expressed a desire to be able to quickly manage the amounts of oxygen (O) and nitrogen (N) in those materials. For example, if the Ti material contains a large amount of oxygen (O), oxides will be produced, which can lead to defects in the printed part.

We introduce a non-destructive screening method for gemstone counterfeit analysis using a HORIBA XGT-9000 X-ray Analytical Microscope. We analyzed two emeralds, and without any sample destruction, we could successfully determine that one of them was an imitated product made of a green-colored glass.

We will introduce a non-destructive method for garnet characterization. In this application note, we used a HORIBA XGT-9000 X-ray Analytical Microscope (micro-XRF) with a 100 μm ultra-high intensity probe to get the elemental composition information of a small garnet stone. Thanks to the micro-spot with high intensity, we could detect the key elements of the small garnet stone just in 30 seconds, and the obtained elemental composition suggested that the garnet stone had similar composition to the chrome poor pyrope from Monte Suímo, Portugal.

Polysilicon, the raw material for silicon wafers, requires strict control of carbon content, which affects its conductivity. As higher purity silicon wafers are required, it is important to understand the amount of carbon contained in polysilicon supplied as a material. However, some carbon is present as carbonate and some is attached as CO2, making it very difficult to distinguish between them and analyze the extremely small amount of carbon.

Co-localized microscopy techniques for pyrite mineral spatial characterization

In this study we have chosen to investigate pyrite and its surrounding minerals in order to identify the different mineral phases as well as the chemical variations from micro- to nano-scale. Using the different microscopes instruments and being co-localized allows a comprehensive characterization of the sample and a precise superimposition of all the images.

Gemstones for jewelry are treated by heating, irradiation, or filling of cracks to make them flawless. We performed imaging analyses using an XGT-9000 X-ray Analytical Microscope on a ruby provided by Mineralab. The transmission X-ray imaging revealed that the ruby included several internal defects, and the fluorescent X-ray imaging revealed that the ruby surface was treated by filling with Pb, Mg and Si which are representative of lead glass.

The XGT-9000 Series can be equipped with various probes and spot sizes providing comprehensive and detailed understanding of geological and mineral samples.

Optical Micro-spectroscopies on a Path to Identify the Source of Life

In this article, we present how our Raman and X-Ray Fluorescence microscopies can be combined to shed some light on the origins of the universe. We show some examples on a meteorite piece and on water inclusion in quartz matrix.

Characterization of Pyrite Inclusions in Lapis Lazuli Using X-ray Fluorescence Micro-imaging

Lapis lazuli is a deep-blue metamorphic rock used as a semiprecious stone which contains inclusions that can impact its value. Pyrite impurities and major elements distribution are studied with the XGT-9000, HORIBA’s new X-ray microscope.

Natural rocks composing the Earth are complex. They consist of an aggregate of one or more minerals. Each mineral can be defined by its chemical composition and its crystalline structure and sometimes can also contain fluid inclusions. Geologists need a powerful characterization technique to get detailed information on the rock formation history. Raman spectroscopy is extremely information-rich (chemical identification, characterization of molecular structures, effects of bonding, environment and stress on a sample). With its non-destructive properties and high spatial resolution (< 1 μm), it is thus a tool of choice for geological studies.

Many particles encountered in mining are characterized by sieves. Recent advances make image analysis practical for samples with sizes larger than several microns in diameter. As particle size decreases, laser diffraction becomes the technique of choice.

Hydraulic fracturing is used in the oil and gas industry to increase the flow of oil and/or gas from a well. Proppants are pumped into the oil well with fracturing fluid to hold the fissures open. The proppant size, shape, and mechanical strength influences the integrity of the newly created fractures, and therefore the flow of oil and gas out of the well.

Characterization of diamond layers by SE: crystalline undoped diamond layers on silicon substrate.

In this work, spectroscopic ellipsometry (SE) was successfully applied to characterize the optical properties and the thicknesses of doped and undoped diamond layers. The sensitivity of this technique enables the doped layer to be distinguished from the undoped one in a sample consisting of a stack of these two layers. Moreover, an interface between the two layers has been detected. This work and others reported previously show clearly that ellipsometry is the technique of choice for the characterization of optical and structural properties of layered materials thanks to its sensitivity and the wide range of information it provides.

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

First name

Last name *

Company or Institution *

Postal code *

City

Country/Region *

State

Email address *

Phone

HORIBA Department

Your message *

I have read and agree to the HORIBA privacy notice

* These fields are mandatory.

Related Products

nanoGPS navYX

Collaborative Correlative Microscopy

EMGA-Expert

Oxygen/Nitrogen/Hydrogen Analyzer
(Flagship High-Accuracy Model)

XGT-9000SL

X-ray Analytical Microscope
with a Super Large Chamber

EMGA-Pro

Oxygen/Nitrogen Analyzer (Entry Model)

XGT-9000

X-ray Analytical Microscope (Micro-XRF)

graphYX

Correlate Multiple Modalities with Ease

EMGA-920

Oxygen/Nitrogen Analyzer

LabRAM Soleil

Raman Spectroscope - Automated Imaging Microscope

LabRAM HR Evolution

LabRAM HR Evolution

Confocal Raman Microscope

EMGA-930

Oxygen/Nitrogen/Hydrogen Analyzer

XploRA™ PLUS

MicroRaman Spectrometer - Confocal Raman Microscope

LabRAM Odyssey

Confocal Raman & High-Resolution Spectrometer

F-CLUE

Compact Hyperspectral Cathodoluminescence

EMIA-Step

Carbon/Sulfur Analyzer (Tubular Electric Resistance Heating Furnace Model)

Cathodoluminescence - CLUE Series

Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

Partica LA-960V2

Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer